Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a well-known non-destructive testing/analysis technique, using a probe that is an electron beam, scanning the surface of the sample, down to nm (nanometer) scale resolution: [1nm = 10-9m]. Scanning Electron Microscopy creates images with high magnification (tens of thousands, hundreds of thousands of times), high resolution (nm). This ability makes Scanning Electron Microscopy suitable for many scientific fields and industrial applications.